TSA, American Airlines Testing 3D Screening of Carry-on Bags at JFK

October 2, 2018 by · Leave a Comment 

The Transportation Security Administration (TSA) is starting to look at luggage in a whole new way. A way that’s faster, more efficient, and will get you through the security checkpoints much faster. It’s called 3D screening and it looks at your blag in three dimensions, not the traditional two.

According to an article in USA Today, the TSA announced plans to begin testing a 3D scanner for carry-on luggage. The device, created by Analogic, has already begun testing with American Airlines at New York’s JFK airport. The test began in late July and uses a ConneCT scanner.

A 2D bag being screened. 3D screening will let you also look at the depth of bags.The partnership with Analogic and TSA could transform aviation security by adding state-of-the-art computed tomography (CT) technology to the security checkpoints, according to José Freig, American’s chief security officer.

“At American, we are always looking at ways to invest in technology that raises the bar on global aviation security while improving the customer experience,” Freig said.
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